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Electrical characterization of Ge microcrystallites by atomic force microscopy using a conducting pr
内容提示:Thin Solid Films 457 (2004) 103–1080040-6090/04/$ - see front matter ? 2003 Elsevier B.V. All rights reserved.doi:10.1016/j.tsf.2003.12.025Electrical characterization of Ge microcrystallites by atomic forcemicroscopy using a conducting probeK. Makihara*, Y. Okamoto, H. Nakagawa, M. Ikeda, H. Murakami, S. Higashi, S. MiyazakiDe...
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